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X11A External Homepage

Beamline X11A

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range Category
Hard X-Ray (1-50 keV)

Energy Range
4.5-35 keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure

Institution(s)
Brookhaven National Laboratory, Material Sciences Department
Brookhaven National Laboratory, Environmental Science Dept.
Canadian Light Source
ETH Labs - Zuerich
Natural Resources Canada
Naval Research Laboratory (NRL)
Naval Surface Warfare Center
New Jersey Institute of Technology
North Carolina State University
SUNY @ Stony Brook, CEMS
Sarah Lawrence College

Research Types
EXAFS of materials and chemical systems in nominal energy range of 4.5-35 keV Techniques: XAFS, DAFS.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Devicharan Chidambaram, Brookhaven National Laboratory, devc@bnl.gov, 344-2643

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Kaumudi Pandya, Science Applications International Corp., pandya@bnl.gov, 6313447734

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Kaumudi Pandya, Science Applications International Corp., pandya@bnl.gov, 6313447734

Beamline Phone
631-344-5611

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
4.5 – 26 keV Si(111) 2 x 10-4 1 x 1011 ph/sec (@ 10 keV , 350mA, 2.58 GeV) 10H x 0.5V (unfocused) 6.0
8 – 35 keV Si(311) 2 x 10-4   10H x 0.5V (unfocused) 6.0

Source Type
Bending magnet

Optical System
Be Window. Channel-cut two-crystal monochromator.

Experimental Apparatus
Solid state detector with digital electronics.
13-element Si-Li Detector. Displex shared with X-11B. Lytle Fluorescence Detector.

Computer System Hardware & Software
Apple Mac G4 with Mac OS 9, XDAC spectroscopy data acquisition software.

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