Find people (by last name)


Advanced search

X14A External Homepage

Beamline X14A

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range Category
Hard X-Ray (1-50 keV)

Energy Range
6-22 keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
Multi wavelength anomalous diffraction
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray reflectivity

Institution(s)
New Jersey Institute of Technology
New York State College of Ceramics
Oak Ridge National Laboratory
University of Tennessee

Research Types
Materials science, in situ real-time high-temp x-ray diffraction, phase transformation, lattice expansion, crystallography, residual strain measurement. Focus on Vehicle Technology, energy transformation and storage materials problems.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Camden Hubbard, Oak Ridge National Laboratory, hubbardcr@ornl.gov, 865/574-4472

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Jianming Bai, University of Tennessee, bai@bnl.gov, 6313442583
Haiyan Chen, New Jersey Institute of Technology, haiyan@bnl.gov, 9736424681

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Jianming Bai, University of Tennessee, bai@bnl.gov, 6313442583

Beamline Phone
631-344-5614

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
5.5 - 25 keV Si(111) 2 x 10-4 2 x 1012 (@ 8 keV, 200 mA, 2.8 Gev) 1.5H x 1.0V 10

Source Type
Bending magnet

Optical System
Mirror: Platinum coated flat single-crystal silicon mirror cylindrical in design, 700 mm long x 100 mm wide; variable vertical focusing or collimation. Radius adjustable from flat to 1 km; incident angles between 1 and 7 mradians; located 7.5 meters from the source; can be removed for high energy operation.

Monochromator: Horizontally focusing double crystal monochromator; adjustable focal point from 13.3 - 30 meters from source; first crystal is water-cooled and flat; second crystal is conically bent; located 9.3 meters from the source.

Experimental Apparatus
Radiation hutch. Six circle Huber diffractometer with split chi-ring. Crystal analyzers (Ge, LiF, graphite crystals). Multiple furnaces for in situ diffraction, Oxford Microfast multi-channel analyzer. Microprobe pinholes down to 10 micron diameter. Si strip position sensitive detector, proportional counters and Pin Diode.

Computer System Hardware & Software
SPEC and CPLOT for data acquisition and data analysis on a PC with Linux operating system; CAMAC modules; Microfast MCA board; Jade XRD pattern processing software; ICDD PDF-4 full fine database.

Links