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Beamline X15A

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
75%

Energy Range Category
Hard X-Ray (1-50 keV)

Energy Range
3-25keV XSW, 10-60keV DEI

Beamline Type
Facility Beamline

Technique(s)
X-ray diffraction, standing waves
Diffraction enhanced imaging

Research Types
X-ray standing wave, Diffraction Enhanced Imaging, x-ray optics development, x-ray radiography.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Zhong Zhong, Brookhaven National Laboratory, zhong@bnl.gov, 344-2117

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Zhong Zhong, Brookhaven National Laboratory, zhong@bnl.gov, 344-2117
Dean Connor Jr., University of North Carolina, connord@bnl.gov, 631-344-5910

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Zhong Zhong, Brookhaven National Laboratory, zhong@bnl.gov, 344-2117

Beamline Phone
631-344-5615

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
3 – 20 keV for XSW Si(111), Si(220), Si(400) for XSW 2 x 10-4 1 x 108-9 ph/sec/mm2 (@ 30 keV, 200 mA, 2.8 GeV) 15H x 2V (unfocused) for XSW 10
15 - 60 keV for DEI Si(111) and Si(333) for DEI 2 x 10-4 1 x 108-9 ph/sec/mm2 @30 keV (200 mA, 2.8 GeV) 115H x 3V for DEI 10

Source Type
Bending magnet

Optical System
Monochromator: For XSW: Double parallel flat crystal monochromator located in hutch; asymmetric crystals available; all axes under computer control; piezo-crystals for fine tuning and feedback control.

For DEI: The dedicated Diffraction Enhanced Imaging setup includes silicon 111 and 333 monochromator with matching analyzer.

Experimental Apparatus
Radiation hutch suitable for white beam mode. X-ray standing wave apparatus. Small 2-circle diffractometer for non-UHV XSW and Evanescent-wave experiments. 50 mm x 100 mm digital CMOS detector, and 200 mm x 250 mm image plate detector with FuJi reader, both with 50 micron pixel size. DEI system using silicon 111 and 333 reflections. Typical scan time is one minute per DEI image set for a 100 mm x 100 mm specimen with 40 mm water-equivalent thickness.

Computer System Hardware & Software
One PC486 with a LINUX operating system, X-Windows, SPEC, and CPLOT for operating the monochromator and experimental apparatus via CAMAC and a PCAII MCA board. One Macintosh Quadra 650 for data analysis. One winddows PC with custom software controls DEI experiment via GPIB interface. One windows PC operate the frame grabber for the 2D x-ray detector.

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