Beamline X21
General Information
Source Type Insertion Device Status Operational General User Beamtime 50% Energy Range Category Hard X-Ray (1-50 keV) Energy Range 6-16 keV
Beamline Type Facility Beamline Technique(s) X-ray diffraction, single crystal X-ray diffraction, surface X-ray diffraction, wide angle X-ray scattering, magnetic X-ray scattering, resonant X-ray scattering, surface X-ray scattering, wide angle
Institution(s) Boston University University of Vermont
Research Types X-ray Scattering in a Magnetic Field, In-situ Materials Processing, X-ray Scattering
Contact Information
Spokesperson 
Christie Nelson, Brookhaven National Laboratory, csnelson@bnl.gov, 344-4916
Local Contact 
Christie Nelson, Brookhaven National Laboratory, csnelson@bnl.gov, 344-4916
Beamtime Scheduler 
Christie Nelson, Brookhaven National Laboratory, csnelson@bnl.gov, 344-4916
Beamline Phone
631-344-5721
Instrumentation
Beamline Characteristics
| Energy Range |
Mono Crystal or Grating |
Resolution (ΔE/E) |
Flux |
Spot Size (mm) |
Total Angular Acceptance (mrad) |
| 6 – 16 keV |
interchangeable Si(111) and multilayer |
~2 x 10-4 for Si(111); ~10-2 for multilayer |
~2 x 1012 ph/sec @ 300mA |
~1 x 1 mm^2 |
1 |
Source Type Hybrid wiggler, 13 periods, 12 cm period Optical System This beamline has two experimental hutches. The upstream hutch is intended for scattering experiments that utilize the 13 T superconducting magnet. The downstream hutch is intended for in-situ film growth experiments, and experiments that utilize a 4-circle Huber diffractometer. Experimental Apparatus Upstream hutch: 13 T superconducting magnet, with vertical field, mounted on a spectrometer table in a horizontal scattering geometry
Downstream hutch: 4-circle Huber diffractometer; displex cryostat; spectrometer table for in-situ film growth Computer System Hardware & Software EPICS-based control system, SPEC
Links
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