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X22C External Homepage
Beamline X22C
General Information
Source Type Bending Magnet Status Operational General User Beamtime 25% Energy Range Category Hard X-Ray (1-50 keV) Energy Range 3-12 keV
Beamline Type Participating Research Team (PRT) Technique(s) X-ray diffraction, single crystal X-ray diffraction, surface X-ray reflectivity X-ray scattering, magnetic
Institution(s) Brookhaven National Laboratory, CMPMSD, X-ray scattering Massachusetts Institute of Technology Rutgers University
Research Types Resonant x-ray scattering studies of electronic order
Contact Information
Spokesperson 
John Hill, Brookhaven National Laboratory, hill@bnl.gov, 344-3736
Local Contact 
Stuart Wilkins, Brookhaven National Laboratory, swilkins@bnl.gov, 344-2851 John Hill, Brookhaven National Laboratory, hill@bnl.gov, 344-3736
Beamtime Scheduler 
Stuart Wilkins, Brookhaven National Laboratory, swilkins@bnl.gov, 344-2851
Beamline Phone
631-344-5622
Instrumentation
Beamline Characteristics
| Energy Range |
Mono Crystal or Grating |
Resolution (ΔE/E) |
Flux |
Spot Size (mm) |
Total Angular Acceptance (mrad) |
| 3 – 12 keV |
Ge(111) |
5 x 10-4 |
1011 ph/sec (@ 8keV, 100 mA, 2.5 GeV, focussed) |
<1H x 1V |
6 (4, focused) |
Source Type Bending magnet Optical System Mirror: Bent cylindrical focusing mirror for 1:1 focusing at a sample; mirror is in vacuum and separated form the ring by a beryllium window; located 10 meters form the source.
Monochromator: Double monochromator, focused in vertical plane, in vacuum and isolated from mirror tank by a beryllium window; located 15 meters from source. Experimental Apparatus Spectrometer: Franke & Heydrich 6-circle, vertical scattering. Computer System Hardware & Software Computer: PC/AT Compatable, Linux OS GPIB ; SPEC control software (by Certified Scientific Software)
Links
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