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X23A2 External Homepage

Beamline X23A2

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range
4.7-30 keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure

Institution(s)
National Institute of Standards & Technology

Research Types
XAFS

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Joseph Woicik, National Institute of Standards & Technology, woicik@bnl.gov, 631/344-4247

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Bruce Ravel, National Institute of Standards & Technology, bravel@bnl.gov, 631/344-3613

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Joseph Woicik, National Institute of Standards & Technology, woicik@bnl.gov, 631/344-4247

Beamline Phone
631-344-5823

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
4.9– 30 keV Si(311) 2 x 10-4 1010 ph/sec (@ monochromator bandpass @ 10 keV, 100mA, 2.5 GeV) 25H x 1.0V 4

Source Type
Bending magnet

Optical System
Monochromator: Upwards reflecting, fixed exit Golovchenko-Cowan design; piezo-feedback stabilized. Single bounce harmonic rejection
mirror.

Experimental Apparatus
Radiation hutch; Ion chambers for transmission and fluorescence measurements. Sample translation stage. Adjustable horizontal and vertical exit slits. 4-element Si drift detector for energy dispersive measurements.

As this is a side station, experimental apparatus must be designed consistent with a pass-through pipe 2 inches below and 1 inch to the side of the A2 beam edge.

Computer System Hardware & Software
Computer (PowerMacintosh) now connected to NSLS network via Ethernet, and laser printer.

Links