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Beamline X24A

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range
1.8-6 keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
X-ray diffraction, standing waves
Auger spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy

Institution(s)
National Institute of Standards & Technology

Research Types
Physics and chemistry of surfaces and bulk condensed matter. Techniques: X-ray standing waves, X-ray photoemission spectroscopy, X-ray fluorescence spectroscopy, SEXAFS, Auger spectroscopy.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Daniel Fischer, National Institute of Standards & Technology, dfischer@bnl.gov, 631-344-5177

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Joseph Woicik, National Institute of Standards & Technology, woicik@bnl.gov, 631/344-4247
Barry Karlin, National Institute of Standards & Technology, karlin@bnl.gov, 631/344-5027

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
Daniel Fischer, National Institute of Standards & Technology, dfischer@bnl.gov, 631-344-5177

Beamline Phone
631-344-5624

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
2.1 – 5.0 keV Si(111)   ~1012 ph/sec ~1 mm diam. 9.5
2.0 – 5 keV Ge(111)   ~1012 ph/sec ~1 mm diam. 9.5
1.8 – 3.6 keV InSb(111)   ~1012 ph/sec ~1 mm diam. ~7
3.4 - 8.2 keV Si(220)   ~1012 ph/sec ~1 mm diam. 9.5

Source Type
Bending magnet

Optical System
Mirror 1: Nickel-coated graphite spherical collimating mirror, 300 mm long by 80 mm wide, radius is 1000 meters; variable incidence angle (0 - 25 mradians); removable from beam path; located 6.8 meters from the source.

Monochromator: UHV, constant-offset double-flat-crystal Golovchenko-Cowan design monochromator; feedback-stabilized; water-cooled first crystal; 15 - 66 deg. Bragg angle range; located 7.7 meters from the source.

Mirror 2: Nickle-coated quartz toroidal focusing mirror; 580 mm long by 88 mm wide, sagittal radius is 100 mm, meridional radius is 800 meters; incident angle is 10.65 mradians; high-energy cutoff is 5 keV; 1:1 focusing at 18.4 meters from the source; located 9.2 meters from the source.

Experimental Apparatus
Beamline X24A is UHV compatible and shares ring vacuum. the UHV experimental chamber includes an XYZ sample manipulator and Physical Electronics analyzer which will soon be replaced with a Scienta Analyzer. General Users may also bring their own chamber - details must be discussed with the PRT.

Computer System Hardware & Software
Beamline X24A uses XDAC spectroscopy data acquisition software running on an Apple Mac G4 with Mac OS 9 operating system. Beamline settings are changed using monochromator and motor controls in the XDAC software program. PC and MAC computers available for file transfer and off-line computation.

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