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Beamline X24C

General Information

Source Type
Bending Magnet

Status
Operational

General User Beamtime
25%

Energy Range
.006-1.8 keV

Beamline Type
Participating Research Team (PRT)

Technique(s)
X-ray reflectivity
Ultraviolet photo absorption spectroscopy
X-ray absorption spectroscopy

Institution(s)
Naval Research Laboratory (NRL)
SFA, Inc.
Universities Space Research Association

Research Types
Reflectance and photoemission spectroscopy.

Contact Information

Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
Jack Rife, Naval Research Laboratory, rife@nrl.navy.mil, 202/767-4654
John Seely, Naval Research Laboratory (NRL), john.seely@nrl.navy.mil, 202/767-3528

Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
Benjawan Kjornrattanawanich, Universities Space Research Association, benjawan@bnl.gov, 6313445683
Johnny Kirkland, SFA, Inc., kirkland@bnl.gov, 631 344 5824

Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
John Seely, Naval Research Laboratory (NRL), john.seely@nrl.navy.mil, 202/767-3528

Beamline Phone
631-344-5824

Instrumentation

Beamline Characteristics

Energy Range Mono Crystal or Grating Resolution (ΔE/E) Flux Spot Size (mm) Total Angular Acceptance (mrad)
2 – 600 eV 1 – 600 grooves/mm 2 x 10-3 109 - 1012 ph/sec 2.0H x 1.2V 6
120 – 900 eV 1 or 2 – 2400 grooves/mm 2 x 10-3 or 8 x 10-4 108 - 1010 ph/sec 2.0H x 1.2V 6
500 -1500 eV multilayer test grating 2 x 10-3 107 ph/sec 2.0H x 1.2V 2
250 - 1500 eV multiplayer mirrors 3% 109 - 1011 ph/sec (@ 3%) 2.0H x 1.2V 6

Source Type
Bending magnet

Optical System
Mirror 1: Platinum-coated, fixed-curvature toroidal mirror (M1); beam collimated into monochromator; 2 degree grazing angle; full orientation control; located 10 meters from the source.

Monochromator: Grating/crystal monochromator; double crystal type scanning motion; uses either gratings or crystals in vacuum with exchange; 3.5 - 85.0 degree grazing angle range; 600 grooves/mm grating has a 2 degree blaze and is gold coated; 2400 grooves/mm grating has a 2 degree blaze and is gold coated; multi-layer test grating has 4 degree blaze, 2000 grooves/mm, coated with 8.0 nm 2D W/C multi-layer and is 1" square, forthcoming full size replacement expected to increase flux and resolving power; located 13.5 meters from the source.

Mirror 2: Platinum-coated, fixed-curvature toroidal mirror (M2) identical to M1; beam focused onto fixed exit slit 26 meters from the source yielding 1:1 image of source; 2 degree grazing angle; full orientation control; located 16 meters from the source.

Experimental Apparatus
A reflectometer mounted in an 18" diameter UHV bell jar with sample adjustable in angle of incidence and orientation around sample normal, detector mount capable of being set at a fixed distance but any angle about sample, whole chamber rotation to alter polarization, and sample preparation/introduction from an auxiliary UHV chamber. No corrosive or non-UHV compatible materials allowed. Calibration chamber with inside dimensions 63” long x 24” diameter, sample translational and angular motions, and 1 cmx1cm Si photodiodes and 2"x2” CMOS area detectors.

Computer System Hardware & Software
Apple Power MC G4 with Mac OS 9: XDAC Labview-based software for data acquisition and control of monochromator and sample/detector motions for the reflectometer and calibration chamber.

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