| Diffraction |
| Multi wavelength anomalous diffraction |
X3A X4A X4C X6A X8C X12B X12C X14A X25 X26C X29A |
| X-ray diffraction, powder |
X10A X10B X14A X16B X16C X17B1 X17B2 X17B3 X17C X18A |
| X-ray diffraction, single crystal |
X7B X14A X16B X17B3 X17C X18A X20A X20C X21 X22A X22C |
| X-ray diffraction, standing waves |
X15A X24A |
| X-ray diffraction, surface |
X6B X10B X18A X19C X20C X21 X22A X22C |
| X-ray diffraction, time resolved |
X7B X14A X17B2 X20C X27C |
| X-ray diffraction, wide angle |
X6B X7B X10A X10B X14A X18A X20A X21 X22A X27C |
| Macromolecular Crystallography |
| Macromolecular crystallography |
X3A X4A X4C X6A X8C X12B X12C X25 X26C X29A |
| Microspectroscopy & Imaging |
| Diffraction enhanced imaging |
X15A |
| Infrared microspectroscopy |
U2A U2B U4IR U10B |
| Microdiffraction Imaging |
X13B X20A X26A |
| Scanning transmission x-ray microscopy |
X1A1 X1A2 |
| X-ray microprobe |
X26A X27A X28B |
| X-ray microtomography |
X2B |
| X-ray topography |
X19C |
| Other |
| High Pressure Research |
U2A X17B2 X17B3 X17C |
| High aspect ratio microsystems technology |
X27B |
| Lithography |
|
| Metrology |
U3C U14B U15 X8A |
| Photon stimulated desorption |
|
| X-ray Footprinting |
X28C |
| Scattering |
| Laser backscattering |
|
| X-ray diffraction, anomalous fine structure |
X11A X23A2 |
| X-ray reflectivity |
U4B X6B X10B X14A X16B X18A X19C X20A X20C X22A X22C X24C |
| X-ray scattering, coherent |
|
| X-ray scattering, liquid |
X19C X22B |
| X-ray scattering, magnetic |
U4B X13A X21 X22C |
| X-ray scattering, resonant |
U4B X13A X19A X21 |
| X-ray scattering, small angle |
X9 X10A X27C |
| X-ray scattering, surface |
X10B X18A X19C X20A X20C X21 X22A |
| X-ray scattering, wide angle |
X7B X9 X10A X10B X16B X18A X21 X22A X27C |
| Spectroscopy |
| Auger spectroscopy |
X24A |
| Infrared transmission and reflection spectrospcopy |
U4IR U12IR |
| Infrared vibrational spectroscopy |
U2A |
| Magnetic circular dichroism |
U4B X13A |
| Magnetospectroscopy |
U12IR |
| THz / millimeter wave spectroscopy |
U12IR |
| Time-resolved spectroscopy |
U4IR U9B U12IR |
| Ultra violet circular dichroism |
U9B U11 |
| Ultraviolet florescence spectroscopy |
U9B |
| Ultraviolet photo absorption spectroscopy |
X24C |
| Ultraviolet photoelectron spectroscopy |
U4A U13UB |
| Ultraviolet photoelectron spectroscopy (UPS), angle-resolved |
U5UA U13UB |
| Ultraviolet photoelectron spectroscopy (UPS), spin-resolved |
U5UA |
| Ultraviolet photoionization spectroscopy |
|
| X-ray absorption spectroscopy |
U1A U4B U12A X1B X3B X10C X11A X11B X18A X18B X19A X23A2 X24C |
| X-ray absorption spectroscopy, extended fine structure |
X3B X10C X11A X11B X18B X19A X23A2 X24A |
| X-ray absorption spectroscopy, fine structure |
U1A X10C X11A X18B X19A X23A2 |
| X-ray absorption spectroscopy, near edge fine structure |
U1A U7A X10C X11A X18B X19A X23A2 |
| X-ray absorption spectroscopy, near edge structure |
U1A U7A X1A1 X10C X11A X11B X18B X19A X23A2 |
| X-ray fluorescence spectroscopy |
U4B X1B X24A |
| X-ray inelastic scattering |
|
| X-ray photoelectron spectroscopy |
U7A U12A X1B X24A |
The National Synchrotron Light Source at Brookhaven National Laboratory in New York, is a national user research
facility funded by the U.S. Department of Energy's Office of Basic Energy Science. The NSLS operates two electron
storage rings: an X-Ray ring and a Vacuum UltraViolet (VUV) ring which provide intense light spanning the electromagnetic
spectrum from the infrared through x-rays. Each year over 2300 scientists from universities, industries and government
labs perform research at the NSLS.
