Joint Workshop for:

The NSLS-II Powder Diffraction Project Beamline

Materials Science Engineering Strategic Planning for NSLS and NSLS-II

Purpose & Scope for the Metrology Session

The Metrology community represents the needs of a broad range of disciplines which ultimately rely on high-performance and absolutely calibrated x-ray and EUV optical components. From high energy density physics to solar astronomy to EUV lithography to synchrotron instrumentation, the demand for optical performance characterization is growing with new technology and science. Metrology beamlines have evolved at NSLS towards wide energy range and high harmonic purity, with radiometric detectors improving to the few percent flux accuracy levels and beyond. The metrology community is expected to continue to utilize beamlines spanning from just a few eV to 10's or even 100's of keV for some applications.

The purpose of this session is to facilitate the formation of alliances which may thrive throughout the life of NSLS and continue into NSLS-II as successful Beamline Access Teams. The science made possible by improved and newly constructed beamlines will be raised to the forefront, and new opportunities will be quantified technically for maximum synergy between the BNL Light Sources' capabilities and the community's needs. This workshop extends the effort initiated at the July NSLS-II Users Workshop, described at the following links:

• http://www.bnl.gov/nsls2/workshops/UserWorkshop_SBDG.asp (scroll down to see Metrology workshop)
• http://www.bnl.gov/u3cx8a/Radiometry%20and%20Metrology%20at%20NSLS-IId.pdf (summary document)

Contact: J. Keister, BNL, JKeister@bnl.gov

• Metrology Session Summary
• Presentations

Metrology Session Attendees (L-R): First Row: Jeff Keister (organizer), Peter Takacs, Lahsen Assoufid, Lonny Berman, Mike Dudley, Ercan Alp, Bajali Raghothamachar; Second Row: Tom Tierney, John Seely, Misha Gubarev, Rich Matyi, Jim Distel; Third Row: Yi Chen, Xianrong Huan, Ken Evans-Lutterodt, Bin Dong; Not Pictured: Cecelia Sanchez-Hanke, Steve Hulbert