July 17-18, 2007

NSLS-II Workshop

Radiometry and Metrology

The radiometry and metrology session was organized by Jeff Keister (SFA, Inc.) and Peter Takacs (BNL). The objective of the session was to identify a community of national programs and users with specific needs for synchrotron radiation for radiometric and metrological characterization of UV and x-ray detectors and optical components. Speakers included Steve Vernon (LLNL), Tom Tierney (LANL), John Seely (NRL), Rob Vest (NIST), Valeriy Yashchuk (LBNL) and Lahsen Assoufid (ANL).

The 25 attendees discussed the scientific importance of having beamlines at NSLS-II and the necessary technical requirements. Such a facility for calibration of optical components is critical to the success of several identified national and international scientific programs, including national security, astronomy, solar physics, high-energy density and plasma physics, EUV lithography, high-performance synchrotron instrumentation, and x-ray optical properties of materials. Wide energy range (5 eV - 200 keV, with most of the work below 20 keV), high spectral-purity (>99% power in-band), and large fractions of beam time are expected to be needed to meet the scientific demand for calibrated UV and x-ray components.

FOR MORE INFORMATION:
Jeff Keister
SFA, Inc., Brookhaven National Laboratory
Email: jkeister@bnl.gov

Peter Takacs
Brookhaven National Laboratory
Email: takacs@bnl.gov