July 17-18, 2007

NSLS-II Workshop

Liquid Interfaces

The liquid interface x-ray scattering community organized its NSLS-II breakout session around current and future science directions, ranging from the physics of liquid metals to biological membranes.

Invited speaker Peter Pershan, of Harvard University, presented a history of interface scattering, and pointed toward possible new directions in polymers and thin films. Mathias Loesche, of Carnegie-Mellon University, discussed membrane systems, stressing the importance of medical relevance for such research and comparing the strengths of x-ray versus neutron techniques. Kent Blasie of the University of Pennsylvania presented interferometric and other methods to extend the basic technique of x-ray reflectivity.

Organizers Elaine DiMasi (BNL), Mark Schlossman (University of Chicago), and Masa Fukuto (BNL), along with Ben Ocko (BNL) led discussions on technical topics: new detectors and simultaneous techniques such as optical microscopy and surface spectroscopy. Ocko and Schlossman also presented important considerations for using high-energy x-rays to study buried interfaces. Micro-focusing and resonant methods were also extensively discussed. More extreme x-ray energy ranges, above 50 keV and below 6 keV, were identified as important new frontiers and will govern the design of upcoming NSLS and NSLS-II beamlines dedicated to scattering from liquid interfaces. The new directions are expected to benefit other surface science communities as well.

FOR MORE INFORMATION:
Elaine DiMasi
Brookhaven National Laboratory
Email: dimasi@bnl.gov

Mark Schlossman
University of Chicago
Email: schloss@bnl.gov

Masa Fukuto
Brookhaven National Laboratory
Email: fukuto@bnl.gov