Palladium M4-Valence-Valence and M5-Valence-Valence Auger Spectra Determined by Auger-Photoelectron Coincidence Spectroscopy

M.T. Butterfield, R.A. Bartynski, and S.L. Hulbert

Superconductivity Induced Electronic Excitation and Phonon Anomalies in Trilayer Bi₂Sr₂Ca₂Cu₃O₁₀

A.V. Boris, D. Munzar, N.N. Kovaleva, B. Liang, C.T. Lin, A. Dubroka, A.V. Pimenov, T. Holden, B. Keimer, Y.-L. Mathis, and C. Bernhard

Polarized Light Drives Anisotropic Expansion in Chalcogenide Glasses

G. Chen, H. Jain, M. Vlcek, S. Khalid, D.A. Drabold, and S.R. Elliott

EXAFS, X-ray Diffraction and Neutron Diffraction Study of the Heusler Alloy Co₂MnSi

B. Ravel, M.P. Raphael, V.G. Harris, J.O. Cross, Q. Huang, R. Ramesh, and V.I. Saraf

Giant Dielectric Effect in CaCu₃Ti₄O₁₂ and Its Cd Analogue

C.C. Homes, T. Vogt, S.M. Shapiro, S. Wakimoto, M.A. Subramanian, and A.P. Ramirez

Electronic Structure of Thin Film Silicon Oxynitrides Measured Using Soft X-Ray Emission and Absorption Spectroscopies

C. McGuinness, D. Fu, J.E. Downes, K.E. Smith, G. Hughes, and J. Roche