2003 NSLS Users' Meeting

EXAFS Under Extreme Experimental Conditions:
EXAFS in the Realms of Small Spot Size, Low Energy, Low Sample Concentration, or Fast Time Resolution

Location: Bldg. 555 - Chemistry Department, Hamilton Room

Date: May 21, 2003

Organizer: B. Ravel, Naval Research Laboratory

Description: EXAFS is well established as an analytical technique applicable to a broad range of scientific disciplines. Within certain experimental constraints, high quality data is easily obtained and is measured regularly even by General Users of synchrotron facilities. In recent years, advanced measurement techniques have overcome formidable empirical obstacles to the measurement of EXAFS under adverse experimental conditions. This workshop focuses on the limits of detectability of EXAFS. These talks explore the experimental and analytical requirements of EXAFS measured under the extreme conditions of small spot size, low energy, low sample concentration, or fast time resolution.

Schedule:

8:50 a.m.	Introductory Remarks
09:00 - 09:45 a.m.	Dr. B. Yaakobi, U. of Rochester “EXAFS Measurements of Laser-generated Shocks with Imploded Target as Radiation Source”
09:50 - 10:35 a.m.	Dr. V. Palshin, Lousiana State U. CAMD “Low Energy XAS: a Si K-edge Study of Silicon-containing Amorphous Thin Carbon Films”
10:35 - 11:00 a.m.	Coffee Break
11:00 - 11:45 a.m.	Dr. L. Chen, ANL “Photo-excited Molecular Structures Probed by Pulsed X-rays”
11:45 - 01:00 p.m.	Lunch Break at workshop location
01:00 - 01:45 p.m.	Dr. S. Kelly, ANL “UL3-edge EXAFS at Environmentally Relevant Concentrations”
01:50 - 02:35 p.m.	Dr. R. Cavell, U. of Alberta, Canada “Microprobe Mapping and EXAFS of Inhomogeneous Materials”
	Adjourn

Register: Please register for the meeting and workshops (including speakers) at http://www.nsls.bnl.gov/users/meeting/2003/registration/