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Amenities Nominations/Awards Related Websites
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Workshop #3 at the NSLS Users' MeetingGrazing Incidence Small Angle ScatteringLocation: Bldg. 510, Physics, Lg Seminar Rm Date: May 17, 2004 Organizers: Description: GISAXS is emerging as an important probe of soft matter systems such as polymer thin films as well as semiconductor and other growth-induced nanostructures. GISAXS is sensitive to both the surface morphology and the internal structure of thin films, and provides information both lateral and normal to the surface on length scales extending from 1-100nm. As a result, GISAXS provides an excellent complement to more conventional nanoscale probes such as atomic force microscopy and transmission electron microscopy. Moreover, because of the limited range of scattering angles GISAXS lends itself to in-situ and real-time studies.The aim of the workshop is to survey recent scientific developments and to discuss future prospects. Schedule: |
The National Synchrotron Light Source at Brookhaven National Laboratory in New York, is a national user research
facility funded by the U.S. Department of Energy's Office of Basic Energy Science. The NSLS operates two electron
storage rings: an X-Ray ring and a Vacuum UltraViolet (VUV) ring which provide intense light spanning the electromagnetic
spectrum from the infrared through x-rays. Each year over 2300 scientists from universities, industries and government
labs perform research at the NSLS.