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Workshop #7 at the NSLS Users' Meeting

Nanoprobes for Nanoscience

Location: Bldg. 510, Physics, Lg Seminar Rm

Date: May 19, 2004

Organizers:
Cecilia Sanchez-Hanke, BNL (hanke@bnl.gov)
Peter Sutter, BNL (psutter@bnl.gov)

Description: The goal of the workshop is to explore the scientific opportunities offered by synchrotron-based Nanoprobes, with emphasis on combined Low-Energy/Photo-Electron Microscope (LEEM/PEEM), X-ray Microscope and X-ray Micro-Diffraction. Overview and applications of these techniques will be given by leading experts in the world. Update of beamline/endstation upgrades and the status of BNL Center for Functional Nanomaterials (CFN) will also be presented.

Schedule:

8:30 a.m. Bob Hwang
"CFN update related with NSLS"
Soft X-Ray Microscopy
9:05 a.m. Harald Ade, North Carolina State University
Compositional and Structural Characterization of Polymers Applications
9:40 a.m. Chris Jacobsen, SUNY Stony Brook
Nanoscale Imaging with Soft X-rays With and Without Lenses
10:15 a.m. Break
Hard X-Ray
10:30 a.m. Cev Noyan, IBM/Columbia
Information Volume in X-Ray Microdiffraction Analysis
11:05 a.m. Barry Lai
Microfluorescence and Micro-XANES for Life Science Applications
11:40 a.m. Kenneth Evans-Lutterodt, BNL-NSLS
The Hard X-ray Micro-diffraction/imaging Project at X13B; Status Report
12:15 p.m. Lunch
LEEM/PEEM (VUV + Soft X-Rays)
1:30 p.m. Rudolph Tromp, IBM T.J. Watson Research Center
LEEM/PEEM: Past, Present, and Future
2:10 p.m. Stefan Heun, Elettra (Trieste, Italy)
XPEEM with Energy Filter
2:50 p.m. Feng Jun, Advanced Light Source
An Ultra-high X-ray Photoemission Electron Microscope Using Electron Mirror Aberration Corrector at the Advanced Light Source
3:30 p.m. Break
3:45 p.m. Discussion Leader: P. Sutter
"NSLS/CFN instrument/plan"
  Discussion Leader: K. Evans-Lutterodt
"Hard X-ray discussion "
  Discussion Leader: C. Jacobsen
"Soft X-ray discussion "