"Stress - Strain - Time Relationships at High Pressure and Temperature"

Donald J. Weidner and Li Li, Stony Brook University

Elastic, anelastic, and plastic behavior of materials is studied with synchrotron-based tools.  X-ray diffraction forms the basis of absolute stress determinations while x-ray imaging yields relative stress determinations.  Time resolution allows the study of plastic processes and anelastic processes.  These studies are carried out on samples under pressures up to 25 GPa and temperatures to 2000K.  NSLS II offers new capabilities that can improve the resolution of stress.