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Workshop 1

"Electrical Nanoprobes"

Date: Monday, May 19, 2008

Organizer(s):
Peter Bennett (Arizona State University) peter.bennett@asu.edu
Peter Sutter (CFN-BNL) psutter@bnl.gov

Location:  Berkner Hall, Bldg. 488, Conference Room A

Description:

Direct electrical characterization of nanostructures is a ubiquitous challenge in the Big World of Nano.  Recent advances in instrumentation have enabled genuine 4-point resistance measurements in UHV using multiple independently controlled STM tips, thus allowing intrinsic transport measurements free from contact artifacts and on single domain structures that can be atomically perfect. This workshop will provide a forum for discussion of the latest results from pioneers in this exciting new field.

Time List of Speakers
9:15 a.m. - 9:30 a.m. Welcoming Remarks -- Peter Bennett
9:30 a.m. - 10:15 a.m. Shuji Hasegawa, University of Tokyo
"The Art and Science of Multi-tip Nanoprobes"
10:15 a.m. - 11:00 a.m. Steve Evans, Leeds University
"Electrical Characterization of Template Grown Nanowires"
11:00 a.m. - 11:30 a.m. Coffee Break
11:30 a.m. - 12:15 p.m. Rolf Möller, Universität Duisburg-Essen
"Ohm's Law on the Nanoscale"
12:15 p.m. - 2:00 p.m. Lunch
2:00 p.m. - 2:45 p.m. Latha Venkataraman, Columbia University
"Conductance of Single Molecules Circuits"
2:45 p.m. - 3:05 p.m. Jun Nogami, University of Toronto, Canada
"Making Nanoscale Metal Features on Atomically Clean Silicon Surfaces with a Stencil"
3:05 p.m. - 3:20 p.m. Coffee Break
3:20 p.m. - 3:50 p.m. Lifeng Hao, Arizona State University
"Transport in Nanoscale Metal-Semiconductor Contacts"
3:50 p.m. - 4:20 p.m. Matthias Bode, Argonne National Laboratory
"The Nanoprobe at Argonne’s CNM:  Concept and First Experiments on the Electrical Failure Analysis in Au Nanowires"
4:20 p.m. - 4:40 p.m. Randall Feenstra, Carnegie Mellon University
"Carrier Transport in Pentacene Probed by Scanning Tunneling Spectroscopy"